Bruker's Value Line etched silicon probes for imaging in TappingMode™ and non-contact mode in air
These particles viewed over the holes may be used for assessment of factors limiting the microscope performance
Square shape for easy alignment with the X-Y axis of SEM stage
For high precision work such as in microscopy and assembly applications
No broken edges and free of debris often associated with other manufacturing processes
Formvar Films (30-60nm) Rotated Bruker's Value Line etched siliconOVERVIEW PRODUCT SPECIFICATIONS Substrates, Support Films for Transmission Electron Microscopy Grids PELCO TEM grid Support Films of Formvar, Formvar Carbon, Carbon, and Silicon Monoxide are available on the following 3. 05mm O. D. grids: 0. 4 x 2mm single slot Cu, 75 mesh Cu, 200 mesh Cu,Ni or Au, 200 mesh Hex Mo, 300 mesh Cu, Ni or Au, 300 mesh Hex Mo, and 400 mesh Cu, Ni, Au, Al, Ti and stainless steel. Support films on the finer mesh grids can